• DocumentCode
    1346845
  • Title

    Current Switching in MgO-Based Magnetic Tunneling Junctions

  • Author

    Zhu, Wenzhong ; Li, Hai ; Chen, Yiran ; Wang, Xiaobin

  • Author_Institution
    Seagate Technol., Bloomington, MN, USA
  • Volume
    47
  • Issue
    1
  • fYear
    2011
  • Firstpage
    156
  • Lastpage
    160
  • Abstract
    Spin-transfer induced magnetization switching in a MgO-based magnetic tunneling junction (MTJ) has been measured over a wide time range. It was found that the switching current response is asymmetric going from the high resistance state to the low resistance state and vice versa. This asymmetry must be taken into consideration to optimize the read-write margin for a 1T1R (single transistor, single MTJ) memory device design, especially since the driving current that the transistor can supply is also asymmetric. The MTJ and the transistor characteristics need to be adjusted so that the spin-transfer switching current asymmetry matches the transistor driving current asymmetry at the desired operating speed. A new device configuration is proposed to achieve this optimization.
  • Keywords
    MRAM devices; boron alloys; cobalt alloys; iron alloys; magnesium compounds; magnetic multilayers; magnetic switching; magnetisation; magnetoelectronics; manganese alloys; platinum alloys; ruthenium; spin polarised transport; tunnelling magnetoresistance; PtMn-CoFe-Ru-CoFeB-MgO-CoFeB; current switching; magnetic tunneling junctions; memory device design; random access memories; read-write margin; resistance state; single transistor; spin-transfer induced magnetization switching; Current density; Electrical resistance measurement; Magnetic tunneling; Switches; Temperature measurement; Transistors; Magnetic switches; random access memories;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/TMAG.2010.2085441
  • Filename
    5598530