DocumentCode
1346845
Title
Current Switching in MgO-Based Magnetic Tunneling Junctions
Author
Zhu, Wenzhong ; Li, Hai ; Chen, Yiran ; Wang, Xiaobin
Author_Institution
Seagate Technol., Bloomington, MN, USA
Volume
47
Issue
1
fYear
2011
Firstpage
156
Lastpage
160
Abstract
Spin-transfer induced magnetization switching in a MgO-based magnetic tunneling junction (MTJ) has been measured over a wide time range. It was found that the switching current response is asymmetric going from the high resistance state to the low resistance state and vice versa. This asymmetry must be taken into consideration to optimize the read-write margin for a 1T1R (single transistor, single MTJ) memory device design, especially since the driving current that the transistor can supply is also asymmetric. The MTJ and the transistor characteristics need to be adjusted so that the spin-transfer switching current asymmetry matches the transistor driving current asymmetry at the desired operating speed. A new device configuration is proposed to achieve this optimization.
Keywords
MRAM devices; boron alloys; cobalt alloys; iron alloys; magnesium compounds; magnetic multilayers; magnetic switching; magnetisation; magnetoelectronics; manganese alloys; platinum alloys; ruthenium; spin polarised transport; tunnelling magnetoresistance; PtMn-CoFe-Ru-CoFeB-MgO-CoFeB; current switching; magnetic tunneling junctions; memory device design; random access memories; read-write margin; resistance state; single transistor; spin-transfer induced magnetization switching; Current density; Electrical resistance measurement; Magnetic tunneling; Switches; Temperature measurement; Transistors; Magnetic switches; random access memories;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2010.2085441
Filename
5598530
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