• DocumentCode
    1346957
  • Title

    Contacts materials performances under break arc in automotive applications

  • Author

    Morin, Laurent ; Jemaa, Nouredine Ben ; Jeannot, Didier ; Pinard, Jacques ; Nedelec, Luc

  • Author_Institution
    Rennes I Univ., France
  • Volume
    23
  • Issue
    2
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    367
  • Lastpage
    375
  • Abstract
    New materials for electrical contacts have been developed recently, based on AgFeOx, AgFeRe, AgZnO, and doped AgSnO2. The work described here aims at evaluating the material transfer characteristics, and the contact resistance behavior, of these materials under break arc in automotive applications (14 V DC, 30-40 A). A comparison is made between these new materials and four reference materials: Ag, AgCdO, AgSnO2, and AgNi. Four of the new materials appear very promising: AgZnO, AgFeOx, doped AgSnO2 io 6, and EMB8. These combine the good transfer performance of AgCdO in inductive load, i.e., in long cathodic arc, with that of AgSnO2 in resistive load, i.e., in short anodic arc. For all materials, contact resistance is much higher in inductive load (7 mΩ) than in resistive load (1 mΩ). An explanation of the different behaviors of these materials is attempted by means of metallographic analysis
  • Keywords
    automotive electronics; circuit-breaking arcs; contact resistance; electrical contacts; silver compounds; 14 V; 30 to 40 A; AgFeO; AgFeOx; AgFeRe; AgZnO; automotive applications; break arc; contact resistance behavior; contacts materials performances; doped AgSnO2 EMB8; doped AgSnO2 io 6; inductive load; long cathodic arc; material transfer characteristics; metallographic analysis; resistive load; short anodic arc; Automobiles; Automotive applications; Automotive materials; Circuit testing; Contact resistance; Contactors; Inorganic materials; Materials testing; Relays; Welding;
  • fLanguage
    English
  • Journal_Title
    Components and Packaging Technologies, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1521-3331
  • Type

    jour

  • DOI
    10.1109/6144.846776
  • Filename
    846776