• DocumentCode
    1346989
  • Title

    Hard And Soft Failures In Dynamic RAM Fault Tolerant Memories

  • Author

    Smith, Arthur L.

  • Author_Institution
    Evaluation Department; Honeywell Process Control Division; Fort Washington, PA 19034 USA.
  • Issue
    1
  • fYear
    1981
  • fDate
    4/1/1981 12:00:00 AM
  • Firstpage
    58
  • Lastpage
    60
  • Abstract
    A system reliability model is developed which includes a dynamic random-access memory (RAM). The model is useful for computing the reliability of a system with a fault-tolerant memory which uses techniques such as hardware redundancy, and error detection and (single error) correction algorithms. Hard and soft failure rates have been estimated to be constants. System behavior is treated as a Markov process.
  • Keywords
    DRAM chips; Error correction; Fault detection; Fault tolerance; Fault tolerant systems; Hardware; Random access memory; Read-write memory; Redundancy; Reliability; Error correction; Fault-tolerant memories; Hard failures; Markov processes; Soft failures; System reliability modeling;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1981.5220963
  • Filename
    5220963
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1346989