• DocumentCode
    1347427
  • Title

    Two Repairable Multistate Devices with General Repair-Time Distributions

  • Author

    Yamashiro, Mitsuo

  • Author_Institution
    Department of Planning Technology; Ashikaga Institute of Technology; 268-1, Oomae-cho; Ashikaga-shi, Tochigi-ken, JAPAN.
  • Issue
    2
  • fYear
    1981
  • fDate
    6/1/1981 12:00:00 AM
  • Firstpage
    204
  • Lastpage
    204
  • Abstract
    The system has two parallel redundant multistate devices with general repair-time distributions. The Laplace transforms of state probability and the mean time to system failure (MTSF) are obtained and a particular case is considered.
  • Keywords
    Hazards; Production engineering; Reliability theory; Technology planning; Multistate devices; Supplementary variable method;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1981.5221038
  • Filename
    5221038
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1347427