• DocumentCode
    1347841
  • Title

    Function dependent fully testable programmable logic array

  • Author

    Mottalib, M.A. ; Prasad, R.V.S.K. ; Dasgupta, P.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Indian Inst. of Technol., Kharagpur, India
  • Volume
    27
  • Issue
    6
  • fYear
    1991
  • fDate
    3/14/1991 12:00:00 AM
  • Firstpage
    495
  • Lastpage
    496
  • Abstract
    Two techniques for designing function-dependent easily testable programmable logic arrays are presented. The techniques can detect all the multiple stuck-at, crosspoint and bridging faults, as compared with most of the existing techniques where some of the faults, especially bridging faults, remain undetected.
  • Keywords
    built-in self test; design engineering; integrated circuit testing; logic arrays; logic design; logic testing; PLA design; PLA testing; bridging faults; cross point faults; design for testability; design technique; easily testable; fully testable; function dependent PLA; high fault coverage; multiple faults; multiple stuck at faults; programmable logic array;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:19910311
  • Filename
    84724
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1347841