DocumentCode
1348511
Title
Probability-based bus headway regularity measure
Author
Lin, James ; Ruan, M.
Author_Institution
Dept. of Civil & Mater. Eng., Univ. of Illinois at Chicago, Chicago, IL, USA
Volume
3
Issue
4
fYear
2009
fDate
12/1/2009 12:00:00 AM
Firstpage
400
Lastpage
408
Abstract
In frequently serviced bus routes passengers are more concerned about bus headway regularity than actual punctuality of bus arrival to the schedule. Buses arriving within very small (bus bunching) or very large headways are of particular concern and much less desirable. In this study, a time-point (stop) level probability-based headway regularity metric to measure bus service reliability is first formulated as a function of bus dwell time, number of stops into the trip, passenger activities (i.e. arrival, boarding and alighting) and expectation (or tolerance) of bus headways. The proposed metric is then applied to evaluate a Chicago Transit Authority bus route by using automatic vehicle location (AVL) data. It is found that headway regularity during a bus trip is closely impacted by dispatching headway. Furthermore, the time-point level service reliability declines as passenger activity levels increase or as the maximum passenger anticipated headway decreases (i.e. passengers become more demanding of frequent bus services). The case study demonstrates that the proposed probability-based headway regularity measure provides an operationable metric to transit agencies in terms of improving the transit service to meet passengers´ expectation and thus increase ridership. Lastly, this study demonstrates another important application of the AVL/APC data.
Keywords
probability; reliability; road vehicles; Chicago Transit Authority bus route; automatic passenger counter data; automatic vehicle location data; bus dwell time; dispatching headway; operationable metric; probability-based bus headway regularity measure; time-point level service reliability;
fLanguage
English
Journal_Title
Intelligent Transport Systems, IET
Publisher
iet
ISSN
1751-956X
Type
jour
DOI
10.1049/iet-its.2008.0088
Filename
5345674
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