• DocumentCode
    1348754
  • Title

    Reliability Growth and Duane Learning Curves

  • Author

    Jaaskelainen, Pentti

  • Author_Institution
    Nokia Electronics; POBox 780; 00101 Helsinki 10, FINLAND.
  • Issue
    2
  • fYear
    1982
  • fDate
    6/1/1982 12:00:00 AM
  • Firstpage
    151
  • Lastpage
    154
  • Abstract
    This paper examines Duane learning curves for reliability improvement between successive reliability tests. A constant failure rate ratio between successive tests gives curved lines on a Duane plot. Gordon´s observation that dominant failures appear exponentially with test time leads to exponential failure rate ratio models. These models, although not the only possible ones, give results that agree well with observations from practice.
  • Keywords
    Electronic equipment testing; Engineering management; Equipment failure; Guidelines; Production; Reliability engineering; Reliability theory; System testing; Duane learning curve; Reliability growth; Reliability testing;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1982.5221280
  • Filename
    5221280