DocumentCode
1348754
Title
Reliability Growth and Duane Learning Curves
Author
Jaaskelainen, Pentti
Author_Institution
Nokia Electronics; POBox 780; 00101 Helsinki 10, FINLAND.
Issue
2
fYear
1982
fDate
6/1/1982 12:00:00 AM
Firstpage
151
Lastpage
154
Abstract
This paper examines Duane learning curves for reliability improvement between successive reliability tests. A constant failure rate ratio between successive tests gives curved lines on a Duane plot. Gordon´s observation that dominant failures appear exponentially with test time leads to exponential failure rate ratio models. These models, although not the only possible ones, give results that agree well with observations from practice.
Keywords
Electronic equipment testing; Engineering management; Equipment failure; Guidelines; Production; Reliability engineering; Reliability theory; System testing; Duane learning curve; Reliability growth; Reliability testing;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1982.5221280
Filename
5221280
Link To Document