DocumentCode
1350163
Title
Roundtable: Reliability of Embedded and Cyber-Physical Systems
Author
Barnum, Sean ; Sastry, Shankar ; Stankovic, John A.
Volume
8
Issue
5
fYear
2010
Firstpage
27
Lastpage
32
Abstract
As part of this special issue, the guest editors put together a roundtable discussion to delve into topics the chosen articles didn´t touch upon. Sean Barnum (MITRE); Shankar Sastry (UC Berkeley); and John A. Stankovic (University of Virginia) spoke on many topics.
Keywords
computer network security; embedded systems; reliability; cyber physical system; embedded system reliability; roundtable discussion; Embedded system; Interviews; Medical services; Reliability; Smart grids; cyberphysical systems; embedded systems; healthcare; reliability; smart grid;
fLanguage
English
Journal_Title
Security & Privacy, IEEE
Publisher
ieee
ISSN
1540-7993
Type
jour
DOI
10.1109/MSP.2010.162
Filename
5601485
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