DocumentCode
1350245
Title
Statistical Approach to Failure Modeling in Accelerated Life Tests
Author
luculano, Gaetano ; Zanini, Antonio
Author_Institution
Dept. of Electronics Engineering; University of Florence; via S. Marta 3; 50139 Firenze, ITALY.
Issue
2
fYear
1983
fDate
6/1/1983 12:00:00 AM
Firstpage
220
Lastpage
220
Keywords
Electronic equipment testing; Knowledge engineering; Life estimation; Life testing; Reliability engineering; Stress; Accelerated life test; Eyring model; Statistical moments; Time to failure; s-Normal joint distribution;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1983.5221540
Filename
5221540
Link To Document