• DocumentCode
    1350769
  • Title

    Integrated MEMS-Tunable VCSELs Using a Self-Aligned Reflow Process

  • Author

    Kögel, Benjamin ; Debernardi, Pierluigi ; Westbergh, Petter ; Gustavsson, Johan S. ; Haglund, Åsa ; Haglund, Erik ; Bengtsson, Jörgen ; Larsson, Anders

  • Author_Institution
    Dept. of Microtechnol. & Nanosci. (MC2), Chalmers Univ. of Technol., Goteborg, Sweden
  • Volume
    48
  • Issue
    2
  • fYear
    2012
  • Firstpage
    144
  • Lastpage
    152
  • Abstract
    A simple microelectromechanical systems technology for wafer-scale integration of tunable vertical-cavity surface-emitting lasers (VCSELs) is presented. The key element is a self-aligned reflow process to form photoresist droplets, which serve as sacrificial layer and preform for a curved micromirror. Using a 3-D electromagnetic model, the half-symmetric cavity is optimized for singlemode emission. The technology is demonstrated for electrically pumped, short-wavelength (850 nm) tunable VCSELs, but is transferable to other wavelengths and material systems. Fabricated devices with 10 μm large current aperture are singlemode and tunable over 24 nm. An improved high-speed design with reduced parasitic capacitance enables direct modulation with 3 dB-bandwidths up to 6 GHz and data transmission at 5 Gbit/s. Small signal analysis shows that the intrinsic parameters (resonance frequency and damping) are wavelength dependent through the differential gain.
  • Keywords
    micro-optomechanical devices; micromirrors; optical tuning; photoresists; semiconductor lasers; surface emitting lasers; 3D electromagnetic model; half symmetric cavity; integrated MEMS; microelectromechanical systems; micromirror; photoresist droplets; self aligned reflow process; tunable VCSEL; wafer scale integration; Air gaps; Apertures; Cavity resonators; Distributed Bragg reflectors; Micromirrors; Resists; Vertical cavity surface emitting lasers; Microelectromechanical system; microlens; micromirror; photoresist; reflow; tunable laser; vertical-cavity surface-emitting laser; wafer-scale integration;
  • fLanguage
    English
  • Journal_Title
    Quantum Electronics, IEEE Journal of
  • Publisher
    ieee
  • ISSN
    0018-9197
  • Type

    jour

  • DOI
    10.1109/JQE.2011.2172191
  • Filename
    6046091