• DocumentCode
    1350812
  • Title

    Matching Forensic Sketches to Mug Shot Photos

  • Author

    Klare, Brendan F. ; Li, Zhifeng ; Jain, Anil K.

  • Author_Institution
    Dept. of Comput. Sci. & Eng., Michigan State Univ., East Lansing, MI, USA
  • Volume
    33
  • Issue
    3
  • fYear
    2011
  • fDate
    3/1/2011 12:00:00 AM
  • Firstpage
    639
  • Lastpage
    646
  • Abstract
    The problem of matching a forensic sketch to a gallery of mug shot images is addressed in this paper. Previous research in sketch matching only offered solutions to matching highly accurate sketches that were drawn while looking at the subject (viewed sketches). Forensic sketches differ from viewed sketches in that they are drawn by a police sketch artist using the description of the subject provided by an eyewitness. To identify forensic sketches, we present a framework called local feature-based discriminant analysis (LFDA). In LFDA, we individually represent both sketches and photos using SIFT feature descriptors and multiscale local binary patterns (MLBP). Multiple discriminant projections are then used on partitioned vectors of the feature-based representation for minimum distance matching. We apply this method to match a data set of 159 forensic sketches against a mug shot gallery containing 10,159 images. Compared to a leading commercial face recognition system, LFDA offers substantial improvements in matching forensic sketches to the corresponding face images. We were able to further improve the matching performance using race and gender information to reduce the target gallery size. Additional experiments demonstrate that the proposed framework leads to state-of-the-art accuracys when matching viewed sketches.
  • Keywords
    face recognition; feature extraction; image matching; statistical analysis; vectors; SIFT feature descriptor; face recognition; feature based representation; forensic sketch matching; local feature based discriminant analysis; minimum distance matching; mug shot image; multiscale local binary pattern; partitioned vector; Accuracy; Face; Face recognition; Feature extraction; Forensics; Principal component analysis; Training; Face recognition; feature selection; forensic sketch; heterogeneous face recognition.; local feature discriminant analysis; viewed sketch; Algorithms; Artificial Intelligence; Biometry; Face; Forensic Medicine; Humans; Image Enhancement; Image Interpretation, Computer-Assisted; Paintings; Pattern Recognition, Automated; Photography; Reproducibility of Results; Subtraction Technique;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2010.180
  • Filename
    5601735