• DocumentCode
    1350934
  • Title

    Improvements of Time-Domain Transmission Waveform and Eye Diagram of Serpentine Delay Line Using Open-Stub Type Guard Traces in Embedded Microstrip Line

  • Author

    Shiue, Guang-Hwa ; Shiu, Jia-Hung ; Chiu, Po-Wei ; Hsu, Che-Ming

  • Author_Institution
    Dept. of Electron. Eng., Chung Yuan Christian Univ., Taoyuan, Taiwan
  • Volume
    1
  • Issue
    11
  • fYear
    2011
  • Firstpage
    1706
  • Lastpage
    1717
  • Abstract
    The utilization of guard traces with two grounded vias at both ends to improve the time-domain transmission (TDT) waveform and eye diagram for a serpentine delay line has been investigated. However, it is not easy to accomplish because the position of the pad of a grounded via is surrounded by a serpentine trace. This is especially true for normal manufacturing technology, where the size of via pad is larger. Therefore, this paper proposes the use of open-stub type guard traces (OSGTs), to reduce crosstalk noise in the TDT waveform and eye diagram of a serpentine delay line, in an embedded microstrip structure. The OSGT, i.e., the guard trace, at one end is a grounded via and at the other is open-ended. The crosstalk reduced efficiency for using OSGTs is almost the same as when using two-grounded-via type guard traces on the serpentine delay line in the time-domain. This is because, the open-end of the OSGTs leads to the noise cancellation mechanism. A graphic method was used to illustrate the noise cancellation mechanism and ringing crosstalk noise generation on the TDT waveform. Two useful design graphs were used to evaluate the maximum flat voltage level of a laddering wave. Based on HSPICE simulation, it was demonstrated that the utilization of OSGTs can significantly reduce the original TDT crosstalk level, thereby greatly improving eye opening and jitter. Finally, this paper also performs time-domain measurement and 3-D full-wave simulation to validate the proposed analyzes.
  • Keywords
    SPICE; delay lines; graph theory; microstrip lines; time-domain analysis; 3D full-wave simulation; HSPICE simulation; OSGT; TDT crosstalk level; TDT waveform; crosstalk noise reduction; embedded microstrip line; embedded microstrip structure; eye diagram; graphic method; noise cancellation mechanism; normal manufacturing technology; open-stub type guard traces; ringing crosstalk noise generation; serpentine delay line; serpentine trace; time-domain transmission waveform; two-grounded-via type guard traces; Conductors; Couplings; Crosstalk; Delay lines; Microstrip; Time domain analysis; Eye diagram; guard traces; open-stub type guard trace; serpentine delay line; signal integrity; time-domain transmission; two-grounded-via type;
  • fLanguage
    English
  • Journal_Title
    Components, Packaging and Manufacturing Technology, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    2156-3950
  • Type

    jour

  • DOI
    10.1109/TCPMT.2011.2168223
  • Filename
    6046116