• DocumentCode
    1351482
  • Title

    Electron Energy Distribution Function Extraction Using Integrated Step Function Response and Regularization Methods

  • Author

    El Saghir, Ahmed ; Kennedy, Chris ; Shannon, Steven

  • Author_Institution
    Dept. of Nucl. Eng., North Carolina State Univ., Raleigh, NC, USA
  • Volume
    38
  • Issue
    2
  • fYear
    2010
  • Firstpage
    156
  • Lastpage
    162
  • Abstract
    Recently, electron energy distribution function (EEDF) extraction techniques have been evaluated using regularized solutions to the integral problem. These techniques do not assume any mathematical representation of the EEDF and solve the integral problem for any function that best represents the EEDF. Also, unlike the more widely used point-by-point extraction of the second-derivative relationship, the integrated relationship between electron current and the EEDF is used, instead of a relatively small fraction of the integrated data in the point-by-point method. In this paper, the electron current for an arbitrary distribution function is derived, assuming that the distribution is a sum of step functions representing such a function. This technique for EEDF extraction is validated by adding noise to numerically generated data and using a regularized least squares (RLS) method to calculate the original function by solving for the individual step function contribution to the total electron current. Comparisons are then made between the expected and the reconstructed solution to evaluate its accuracy with respect to EEDF reconstruction and integrated normalization of the electron density.
  • Keywords
    least squares approximations; plasma diagnostics; electron energy distribution function extraction; integrated step function response; regularization methods; regularized least squares; second-derivative relationship; Druyvesteyn; Tikhonov regularization; electron energy distribution function (EEDF);
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2009.2036013
  • Filename
    5350695