DocumentCode
1351630
Title
Modified Goodness-of-Fit Tests for Gamma Distributions with Unknown Location and Scale Parameters
Author
Woodruff, Brian W. ; Viviano, Philip J. ; Moore, Albert H. ; Dunne, Edward J.
Author_Institution
Department of Mathematics; Air Force Institute of Technology; Wright-Patterson AFB, Ohio 45433 USA.
Issue
3
fYear
1984
Firstpage
241
Lastpage
245
Abstract
The common Kolmogorov-Smirnov, Anderson-Darling, and Cramer-von Mises goodness-of-fit tests require continuous underlying distributions with known parameters. This paper gives tables of critical values for these tests for gamma distributions with unknown location and scale parameters and known shape parameters. The powers of these tests are given for a number of alternative distributions. A relation between the critical values and the inverse square of the shape parameter is presented. For larger sample sizes, the modified CvM test is usually the most powerful of the three tests. One exception is for the alternative of a lognormal distribution where the modified AD test is most powerful. The equation, C = ao + a1(1/Ã2) describes the relation between critical value and shape parameter quite well.
Keywords
Exponential distribution; Maximum likelihood estimation; Monte Carlo methods; Parameter estimation; Personnel; Shape; Statistical analysis; Statistical distributions; Testing; Thermal force; Empirical Cdf; Goodness-of-fit tests; Monte Carlo simulation;
fLanguage
English
Journal_Title
Reliability, IEEE Transactions on
Publisher
ieee
ISSN
0018-9529
Type
jour
DOI
10.1109/TR.1984.5221801
Filename
5221801
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