• DocumentCode
    1351688
  • Title

    Variable dwell-time code acquisition for direct-sequence spread-spectrum systems on time-variant Rayleigh fading channels

  • Author

    Wang, Huan-Chun ; Sheen, Wern-Ho

  • Author_Institution
    Dept. of Electr. Eng., Nat. Chung Cheng Univ., Chia-Yi, Taiwan
  • Volume
    48
  • Issue
    6
  • fYear
    2000
  • fDate
    6/1/2000 12:00:00 AM
  • Firstpage
    1037
  • Lastpage
    1046
  • Abstract
    Variable dwell-time code acquisition based on multiple-dwell or sequential linear tests is investigated for direct-sequence spread-spectrum systems on time-variant Rayleigh fading channels. Unlike in the conventional additive white Gaussian noise channels, the channel memory incurred by fading renders the exact analysis of the acquisition systems extremely difficult, if not impossible. In this paper, a novel method is developed to evaluate the mean acquisition time of the acquisition systems very accurately. The effects of Rayleigh fading are evaluated, and comparisons are made between double-dwell and sequential linear tests. Numerical results show that Rayleigh fading may result in 1-4-dB loss in performance, and the sequential linear test can outperform double-dwell test by a margin of 1-2 dB. The analytical results are verified by computer simulations
  • Keywords
    Rayleigh channels; probability; pseudonoise codes; spread spectrum communication; synchronisation; time-varying channels; DS-SS systems; PN code acquisition; additive white Gaussian noise channels; channel memory; computer simulations; detection probability; direct-sequence spread-spectrum systems; false alarm probability; mean acquisition time; multiple-dwell tests; sequential linear tests; time-variant Rayleigh fading channels; variable dwell-time code acquisition; AWGN; Additive white noise; Computer simulation; Detectors; Fading; Performance analysis; Rayleigh channels; Sequential analysis; Spread spectrum communication; System testing;
  • fLanguage
    English
  • Journal_Title
    Communications, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0090-6778
  • Type

    jour

  • DOI
    10.1109/26.848566
  • Filename
    848566