• DocumentCode
    1351708
  • Title

    Measurement of High Sensitivity and Low Crosstalk of Zero-Space Microlens for 2.8- \\mu\\hbox {m} -Pitch Active Pixel Sensor

  • Author

    Jin, Xiangliang ; Fan, Xiaoping ; Liu, Zhibi ; Kuang, Zhangqu ; Cheng, Jie ; Chen, Jie ; Liu, Yu ; Yang, Jun

  • Author_Institution
    SuperPix Micro Technol. Ltd., Beijing, China
  • Volume
    57
  • Issue
    2
  • fYear
    2010
  • Firstpage
    415
  • Lastpage
    421
  • Abstract
    This paper describes the difference between normal microlenses and zero-space microlenses in image sensors. The investigation of both sensitivity and crosstalk has been implemented for normal microlenses and zero-space microlenses that are fabricated on a 2.8-μm pinned photodiode array of 640 (row) by 480 (column) based on an 0.18-μm -CMOS process. The simulation results show that the zero-space microlens technology increases the pixel sensitivity by about 75.61% and decreases the crosstalk by about 9.4% compared to the normal microlens technology. This paper presents the sensitivity analysis of both normal microlenses and zero-space microlenses based on the wafer test data from the Teradyne IP750, which is a special wafer test platform for CMOS sensors. The results of the statistical data of the wafer test show that the sensitivity of the zero-space microlenses has been improved by about 73.6% on the red pixel (69.6% on the green pixel and 76.3% on the blue pixel) compared with that of the normal microlenses. Using a similar statistical method, the crosstalk characteristics of both the zero-space microlenses and the normal microlenses have been measured as well. Compared with the normal microlenses, the testing results show that the crosstalk of green light in red light is reduced by about 7.244% and the crosstalk of blue light in red light is reduced by about 41.447% due to the use of the zero-space microlens technology. More importantly, this paper also provides the comparison and analysis of the real images taken by CMOS image sensors with the normal microlenses and the zero-space microlenses, respectively. From the comparison of image results, the image luminance of the zero-space microlenses is higher than that of the normal microlenses, and the image definition of the zero-space microlenses is clearer than that of the normal microlenses as well. So far, the silicon results show that the zero-space microlens technology is a better choice than- - the normal microlens technology for CMOS image sensors of a small-size pixel.
  • Keywords
    CMOS image sensors; image resolution; microlenses; optical arrays; photodiodes; statistics; CMOS image sensors; Teradyne IP750; green light; image definition; image luminance; image sensor; normal microlenses; photodiode array; pitch active pixel sensor; pixel sensitivity; red light; sensitivity analysis; size 0.18 μm to 2.8 μm; statistical data; wafer test data; zero-space microlens; Active pixel sensor; crosstalk; imager sensor; microlens; normal microlens; sensitivity; zero-space microlens;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2009.2037177
  • Filename
    5350744