• DocumentCode
    1352212
  • Title

    Diffraction at a thick screen including corrugations on the top face

  • Author

    Albani, Matteo ; Capolino, Filippo ; Maci, Stefano ; Tiberio, Roberto

  • Author_Institution
    Coll. of Eng., Siena Univ., Italy
  • Volume
    45
  • Issue
    2
  • fYear
    1997
  • fDate
    2/1/1997 12:00:00 AM
  • Firstpage
    277
  • Lastpage
    283
  • Abstract
    A closed-form high-frequency solution is presented for the near-field scattering by a thick screen illuminated by a line source at a finite distance. This solution is applicable to a thick screen with perfectly conducting side walls and either perfectly conducting or artificially soft boundary conditions on the face joining the two wedges. This latter condition is obtained in practice by etching on that face quarter of a wavelength deep corrugations with a small periodicity with respect to the wavelength. It is shown that the artificially soft surface provides a strong shadowing for both polarizations; thus, it is suggested that such configurations may usefully be employed to obtain an effective shielding from undesired interferences. Several numerical calculations have been carried out and compared with those from a method of moments (MoM) solution for testing the accuracy of our formulation, as well as to demonstrate the effectiveness of the corrugations in shielding arbitrarily polarized incident field
  • Keywords
    electromagnetic shielding; electromagnetic wave diffraction; electromagnetic wave scattering; integral equations; interference suppression; light polarisation; EM diffraction; MoM solution; artificially soft boundary conditions; corrugations; distance; double diffraction; generalised Fresnel integrals; interference shielding; line source; method of moments; near-field scattering; perfectly conducting boundary conditions; perfectly conducting side walls; polarized incident field; shadowing; small periodicity; thick screen; top face; wedges; Boundary conditions; Corrugated surfaces; Diffraction; Etching; Interference; Moment methods; Polarization; Scattering; Shadow mapping; Testing;
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/8.560346
  • Filename
    560346