• DocumentCode
    1354160
  • Title

    Nonlinear Steady-State III–V FET Model for Microwave Antenna Switch Applications

  • Author

    Takatani, Shinichiro ; Chen, Cheng-Duan

  • Author_Institution
    WIN Semicond. Corp., Tao Yuan Shien, Taiwan
  • Volume
    58
  • Issue
    12
  • fYear
    2011
  • Firstpage
    4301
  • Lastpage
    4308
  • Abstract
    A nonlinear III-V field-effect transistor model is proposed for designing microwave antenna switches and related circuits, off-state gate and drain capacitance values of a pseudo-morphic high-electron-mobility transistor (HEMT) derived from pulsed S-parameters with a deep OFF-state quiescent gate voltage are found to be much less voltage dependent than capacitance values measured by a nonpulsed bias owing to trap-induced dispersion effects. Our device model based on pulsed-bias CV characteristics accurately simulates switch nonlinearity. Both gate and drain capacitance values are assumed to be nonlinear, and a charge expression is developed for model implementation. For both capacitance values, a nonpulsed-bias CV curve is also utilized to maintain accurate capacitance at the quiescent voltage and, thus, accurate simulation of off-switch isolation. Additional terms are introduced to an existing drain current model to improve accuracy at high Vgs/low Vds and subthreshold regions. Furthermore, the model is extended to multiple-gate devices. Harmonics generated from both OFF- and ON-state switches, insertion loss, and isolation are accurately predicted for both single- and multiple-gate HEMTs.
  • Keywords
    III-V semiconductors; S-parameters; field effect transistor switches; high electron mobility transistors; microwave antennas; microwave switches; HEMT; drain capacitance values; field-effect transistor model; microwave antenna switch applications; nonlinear steady-state III-V FET model; off-state gate; pseudomorphic high-electron-mobility transistor; pulsed S-parameters; pulsed-bias CV characteristics; subthreshold regions; Capacitance; FETs; Integrated circuit modeling; Logic gates; Polynomials; Switches; Voltage measurement; Field-effect transistor (FET) switches; harmonic distortion (HD); microwave switches; modeling; nonlinear distortion;
  • fLanguage
    English
  • Journal_Title
    Electron Devices, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9383
  • Type

    jour

  • DOI
    10.1109/TED.2011.2169415
  • Filename
    6054026