• DocumentCode
    1354321
  • Title

    Three-level differential buffer for increasing noise margin in pseudo-differential signalling

  • Author

    Ha, Kyung-Soo ; Kim, Lee-Sup ; Bae, Seung-Jun ; Park, K.-I. ; Choi, Jin Soo ; Jun, Young-Hyun

  • Author_Institution
    DRAM Design, Memory Div., Samsung Electron., Hwasung, South Korea
  • Volume
    46
  • Issue
    21
  • fYear
    2010
  • fDate
    10/1/2010 12:00:00 AM
  • Firstpage
    1429
  • Lastpage
    1431
  • Abstract
    A 5Gbit/s/pin transceiver for high-speed memory interfaces is implemented in a 0.18 m CMOS process. In general, memory interfaces use single-ended signalling with a reference signal because the chip cost is closely related to the number of pins. However, as the data rate increases, reference voltage noise and simultaneous switching noise reduce voltage and timing margin of receiver input signals. Pseudo-differential signalling (PDS) is used to solve the problems, however a previous receiver using PDS is sensitive to core power noise because the receiver uses three-level signals with reduced noise margin. The three-level differential buffer (TLDB) which is robust to core power noise is proposed and the noise margin of the TLDB outputs is larger than that of outputs of a previous PDS receiver.
  • Keywords
    CMOS memory circuits; buffer circuits; high-speed integrated circuits; integrated memory circuits; transceivers; CMOS; bit rate 5 Gbit/s; core power noise; high-speed memory interfaces; noise margin; pseudo-differential signaling; pseudo-differential signalling; reference voltage noise; simultaneous switching noise; single-ended signalling; size 0.18 mum; three-level differential buffer; transceiver;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el.2010.2095
  • Filename
    5604791