• DocumentCode
    1354383
  • Title

    Computer-Assisted Markov Failure Modeling of Process Control Systems

  • Author

    Aldemir, Tunc

  • Author_Institution
    The Ohio State University, Columbus, 206 West 18th Avenue; Columbus, Ohio 43210 USA.
  • Issue
    1
  • fYear
    1987
  • fDate
    4/1/1987 12:00:00 AM
  • Firstpage
    133
  • Lastpage
    144
  • Abstract
    Process control systems (PCS) are systems with control loops and continuous state dynamic variables such as pressure, temperature, and liquid level. Existing computer-assisted failure modeling schemes for PCS are based on a static description of system operation (eg, by digraphs, signal-flow-based graphs). This paper presents a dynamic approach to the failure modeling of PCS. The givens for the methodology are: 1) a set of first order differential equations with feedback describing the interaction between system variables, 2) failure and repair rates for the control units constituting the PCS. The methodology is based on the discrete state space-discrete time representation of PCS dynamics. Probabilistic system behavior is simulated by a Markov chain. An algorithm is developed for the mechanized construction of the transition matrix. Input preparation for the algorithm is illustrated by examples. Useful features of the methodology are: 1) failure model accuracy can be verified or improved by a change in the input data for mechanized model construction, 2) effect of changes in system parameters on PCS failure characteristics can be quantified. These features are demonstrated on a simple level-control system. The limitations of the methodology are discussed.
  • Keywords
    Control system synthesis; Differential equations; Failure analysis; Level control; Personal communication networks; Pressure control; Process control; Proportional control; Signal processing; Temperature control; Common-cause failure; Computer-assisted model construction; Dynamic failure modeling; Markov failure analysis; Process control system;
  • fLanguage
    English
  • Journal_Title
    Reliability, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9529
  • Type

    jour

  • DOI
    10.1109/TR.1987.5222318
  • Filename
    5222318