• DocumentCode
    1359603
  • Title

    Time-domain macromodel for lossy VLSI interconnects

  • Author

    Cappuccino, G. ; Cocorullo, G.

  • Author_Institution
    Dept. of Electron. Comput. Sci. & Syst., Calabria Univ., Italy
  • Volume
    36
  • Issue
    14
  • fYear
    2000
  • fDate
    7/6/2000 12:00:00 AM
  • Firstpage
    1207
  • Lastpage
    1208
  • Abstract
    A new time-domain model that enables loss effects on the input impedance of on-chip transmission lines during switching transients to be accurately taken into account is presented. The model has been specifically developed for use in conjunction with MOS macromodels to predict the electrical behaviour of matched CMOS buffers. It solves the problem of mixed frequency/time domain analysis by replacing the lines with a lumped time-varying resistor
  • Keywords
    CMOS integrated circuits; VLSI; integrated circuit interconnections; integrated circuit modelling; time-domain analysis; transient analysis; MOS macromodels; input impedance; loss effects; lossy VLSI interconnects; lumped time-varying resistor; matched CMOS buffers; mixed frequency/time domain analysis; on-chip transmission lines; switching transients; time-domain macromodel;
  • fLanguage
    English
  • Journal_Title
    Electronics Letters
  • Publisher
    iet
  • ISSN
    0013-5194
  • Type

    jour

  • DOI
    10.1049/el:20000883
  • Filename
    852244
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1359603