• DocumentCode
    1359793
  • Title

    Incorporating the DC load flow model in the decomposition-simulation method of multi-area reliability evaluation

  • Author

    Mitra, J. ; Singh, C.

  • Author_Institution
    Dept. of Electr. Eng., Texas A&M Univ., College Station, TX, USA
  • Volume
    11
  • Issue
    3
  • fYear
    1996
  • fDate
    8/1/1996 12:00:00 AM
  • Firstpage
    1245
  • Lastpage
    1254
  • Abstract
    This paper presents a computationally viable means of incorporating the DC load flow model in the decomposition-simulation method of multi-area reliability evaluation. The implementation described herein uses a multi-state generation model for each area, a cluster-based multi-area load model which accommodates load correlation between areas, a linear programming model with DC load flow constraints for determining the partitioning states in the decomposition phase, and a similar LP model for determining acceptability of sampled states in the simulation phase. Formulations have been described which enhance the speed and accuracy of the method. The implementation has been tested on 3-area, 4-area, and 5-area cases, and the results obtained have been compared with those produced by an explicit Monte-Carlo simulation. While the results obtained from both methods are similar, the method described has been shown to be considerably faster than explicit simulation
  • Keywords
    Monte Carlo methods; linear programming; load flow; power system analysis computing; power system interconnection; power system reliability; DC load flow model; cluster-based multi-area load model; decomposition-simulation method; explicit Monte-Carlo simulation; linear programming model; load correlation; multi-area reliability evaluation; multi-state generation model; partitioning states; Computational modeling; DC generators; Interconnected systems; Linear programming; Load flow; Load modeling; Power markets; Power system reliability; State-space methods; Testing;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.535596
  • Filename
    535596