• DocumentCode
    1360877
  • Title

    Increasing the Efficiency of Simulation-Based Functional Verification Through Unsupervised Support Vector Analysis

  • Author

    Guzey, Onur ; Wang, Li.-C. ; Levitt, Jeremy R. ; Foster, Harry

  • Volume
    29
  • Issue
    1
  • fYear
    2010
  • Firstpage
    138
  • Lastpage
    148
  • Abstract
    Success of simulation-based functional verification depends on the quality and diversity of the verification tests that are simulated. The objective of test generation methods is to generate tests that exercise as much different functionality of the hardware designs as possible. In this paper, we propose a novel methodology that generates a model of the verification tests in a given test set using unsupervised support vector analysis. One potential application is to use this model to select tests that are likely to exercise functionality that has not been tested so far. Since this selection can be done before simulation, it can be used to filter redundant tests and reduce required simulation cycles. Our methodology can be combined with a test generation method like constrained-random test generation to increase its effectiveness without making fundamental changes to the verification flow. Experimental results based on application of the proposed methodology to the OpenSparc T1 processor are reported to demonstrate the practicality of our approach.
  • Keywords
    Analytical models; Automation; Circuit simulation; Circuit testing; Computer graphics; Filters; Hardware; Integrated circuit modeling; Kernel; Support vector machines; Design automation; functional verification; integrated circuits; simulation; support vector machines;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/TCAD.2009.2034347
  • Filename
    5356289