A Scalable SCR Compact Model for ESD Circuit Simulation

Author

Di Sarro, James P. ; Rosenbaum, Elyse

Author_Institution

Dept. of Electr. & Comput. Eng., Univ. of Illinois at Urbana-Champaign, Urbana, IL, USA

Volume

57

Issue

12

fYear

2010

Firstpage

3275

Lastpage

3286

Abstract

A scalable compact model for SCR-based electrostatic discharge (ESD) protection devices is presented. This model captures the effect that layout spacing has on SCR characteristics, such as holding voltage and trigger current. The model also captures both the delayed turn-on of the SCR, which results in large voltage overshoots during fast rise-time ESD events and the charge removal mechanisms that underlie the turn-off transient. Bias and time dependences of SCR on-resistance are captured with a resistance model that accounts for self-heating.

Keywords

circuit layout; circuit simulation; electrostatic discharge; heating; semiconductor device models; thyristors; ESD circuit simulation; SCR on-resistance; charge removal mechanisms; electrostatic discharge protection; holding voltage; layout spacing; scalable SCR compact model; self-heating; trigger current; turn-off transient; Electrostatic discharge; Integrated circuit modeling; Mathematical model; P-i-n diodes; Scalability; Thyristors; Compact modeling; electrostatic discharge (ESD); silicon-controlled rectifier (SCR);

fLanguage

English

Journal_Title

Electron Devices, IEEE Transactions on

Publisher

ieee

ISSN

0018-9383

Type

jour

DOI

10.1109/TED.2010.2081674

Filename

5610716