• DocumentCode
    1362331
  • Title

    Extending the Best Linear Approximation to Characterize the Nonlinear Distortion in GaN HEMTs

  • Author

    Thorsell, Mattias ; Andersson, Kristoffer ; Pailloncy, Guillaume ; Rolain, Yves

  • Author_Institution
    GigaHertz Centre, Chalmers Univ. of Technol., Göteborg, Sweden
  • Volume
    59
  • Issue
    12
  • fYear
    2011
  • Firstpage
    3087
  • Lastpage
    3094
  • Abstract
    In this paper, the best linear approximation (BLA) is extended to include second-order nonlinearities. This extension is particularly useful for the analysis of low-frequency (LF) distortion due to self-mixing. The self-mixing of a modulated signal due to even-order nonlinear distortion creates a spectrum around dc, as well as around the high order even harmonics. The frequency response at dc can be used to determine long-term memory effects such as trapping and self-heating. The extended BLA is extracted for a GaN-based HEMT to analyze the LF distortion and demonstrate the possibilities with the proposed method.
  • Keywords
    III-V semiconductors; approximation theory; gallium compounds; high electron mobility transistors; wide band gap semiconductors; GaN; HEMT; best linear approximation; low-frequency distortion; nonlinear distortion; second-order nonlinearities; self-heating; self-mixing; trapping; Gallium nitride; HEMTs; Harmonic analysis; Linear approximation; Noise measurement; Nonlinear distortion; Linear approximation; gallium nitride (GaN); high electron-mobility transistors (HEMTs); linear characteristics; nonlinear distortion;
  • fLanguage
    English
  • Journal_Title
    Microwave Theory and Techniques, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9480
  • Type

    jour

  • DOI
    10.1109/TMTT.2011.2169423
  • Filename
    6061918