DocumentCode
1362331
Title
Extending the Best Linear Approximation to Characterize the Nonlinear Distortion in GaN HEMTs
Author
Thorsell, Mattias ; Andersson, Kristoffer ; Pailloncy, Guillaume ; Rolain, Yves
Author_Institution
GigaHertz Centre, Chalmers Univ. of Technol., Göteborg, Sweden
Volume
59
Issue
12
fYear
2011
Firstpage
3087
Lastpage
3094
Abstract
In this paper, the best linear approximation (BLA) is extended to include second-order nonlinearities. This extension is particularly useful for the analysis of low-frequency (LF) distortion due to self-mixing. The self-mixing of a modulated signal due to even-order nonlinear distortion creates a spectrum around dc, as well as around the high order even harmonics. The frequency response at dc can be used to determine long-term memory effects such as trapping and self-heating. The extended BLA is extracted for a GaN-based HEMT to analyze the LF distortion and demonstrate the possibilities with the proposed method.
Keywords
III-V semiconductors; approximation theory; gallium compounds; high electron mobility transistors; wide band gap semiconductors; GaN; HEMT; best linear approximation; low-frequency distortion; nonlinear distortion; second-order nonlinearities; self-heating; self-mixing; trapping; Gallium nitride; HEMTs; Harmonic analysis; Linear approximation; Noise measurement; Nonlinear distortion; Linear approximation; gallium nitride (GaN); high electron-mobility transistors (HEMTs); linear characteristics; nonlinear distortion;
fLanguage
English
Journal_Title
Microwave Theory and Techniques, IEEE Transactions on
Publisher
ieee
ISSN
0018-9480
Type
jour
DOI
10.1109/TMTT.2011.2169423
Filename
6061918
Link To Document