DocumentCode
1363122
Title
Comparison of Noise Performance of the dc SQUID Bootstrap Circuit With That of the Standard Flux Modulation dc SQUID Readout Scheme
Author
Zhang, Yi ; Zhang, Guofeng ; Wang, Huiwu ; Wang, Yongliang ; Dong, Hui ; Xie, Xiaoming ; Mück, Michael ; Krause, Hans-Joachim ; Braginski, Alex I. ; Offenhäusser, Andreas ; Jiang, Mianheng
Author_Institution
Inst. of Bioand Nanosystems (IBN-2), Forschungszentrum Julich, Julich, Germany
Volume
21
Issue
3
fYear
2011
fDate
6/1/2011 12:00:00 AM
Firstpage
501
Lastpage
504
Abstract
We recently presented a direct readout technique for the dc Superconducting QUantum Interference Device (SQUID) without flux modulation (FM), operated in voltage bias mode, and named it the SQUID Bootstrap Circuit (SBC). The SBC combines additional voltage and current feedbacks to minimize the room-temperature preamplifier noise. The main point of this paper is to compare the flux noise performance of the SBC readout with that of the FM scheme using a sine wave modulation signal. Several liquid-helium-cooled SQUID magnetometers with different layouts and loop inductances were characterized using these two readout schemes. Measured noise was comparable to or even lower than that measured by FM electronics. Furthermore, the SBC noise performance was evaluated as function of resistance which, when properly adjusted, permits us to nearly fulfill the critical noise suppression condition. We believe SBC to be a promising candidate for multi-channel SQUID systems.
Keywords
SQUIDs; DC SQUID bootstrap circuit; dc superconducting quantum interference device; direct readout technique; flux noise performance; liquid-helium-cooled SQUID magnetometers; room-temperature preamplifier noise; sine wave modulation signal; standard flux modulation DC SQUID readout scheme; voltage bias mode; Coils; Frequency modulation; Layout; Noise; Noise measurement; Readout electronics; SQUIDs; Dc SQUID; SQUID bootstrap circuit (SBC); SQUID noise; readout electronics;
fLanguage
English
Journal_Title
Applied Superconductivity, IEEE Transactions on
Publisher
ieee
ISSN
1051-8223
Type
jour
DOI
10.1109/TASC.2010.2078790
Filename
5611626
Link To Document