DocumentCode
1364018
Title
P1149.4 Mixed-Signal Test Bus
Author
Cron, Adam
Volume
13
Issue
3
fYear
1996
Firstpage
98
Keywords
Assembly; Automatic testing; Built-in self-test; Circuit testing; Electronic equipment testing; Manufacturing; Observability; Pins; Proposals; Switches;
fLanguage
English
Journal_Title
Design & Test of Computers, IEEE
Publisher
ieee
ISSN
0740-7475
Type
jour
DOI
10.1109/MDT.1996.536100
Filename
536100
Link To Document