• DocumentCode
    1365103
  • Title

    Multiple Loaded Scatterer Method for E-Field Mapping Applications

  • Author

    Abou-Khousa, Mohamed A. ; Zoughi, Reza

  • Author_Institution
    Imaging Res. Labs., Univ. of Western Ontario, London, ON, Canada
  • Volume
    58
  • Issue
    3
  • fYear
    2010
  • fDate
    3/1/2010 12:00:00 AM
  • Firstpage
    900
  • Lastpage
    907
  • Abstract
    Spatial mapping of electric field distribution is an important objective in many applications including antenna pattern, radar cross-section, and specific absorption rate measurements. Modulated scatterer technique (MST) based on small loaded dipoles has been successfully used for these purposes for many years. However, MST suffers from several inherent limitations. These limitations become more severe as the frequency increases. This paper introduces a new and efficient method based on a multiple loaded scatterer (MLS) approach. The proposed method allows for accurate recovery of an unknown incident electric field with measurements conducted at a single observation point. The formulation of the MLS method along with several key simulation results illustrating its efficacy for electric field distribution measurement is presented. In addition, the results of several comparisons with conventional MST are also provided.
  • Keywords
    antenna radiation patterns; p-i-n diodes; radar cross-sections; E-field mapping applications; antenna pattern; electric field distribution; modulated scatterer technique; multiple loaded scatterer method; radar cross-section; spatial mapping; specific absorption rate measurements; Antenna measurements; Electric variables measurement; Electromagnetic compatibility; Electromagnetic scattering; Frequency; Microwave imaging; Multilevel systems; Nondestructive testing; Probes; Radar scattering; Electric field mapping; PIN diode; modulated scatterer technique (MST); multiple loaded scatterer (MLS);
  • fLanguage
    English
  • Journal_Title
    Antennas and Propagation, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-926X
  • Type

    jour

  • DOI
    10.1109/TAP.2009.2039302
  • Filename
    5361414