DocumentCode
1365693
Title
Constitutive and Aging Behavior of Sn3.0Ag0.5Cu Solder Alloy
Author
Mysore, Kaushik ; Subbarayan, Ganesh ; Gupta, Vikas ; Zhang, Ron
Author_Institution
Dept. of Mech. Eng., Purdue Univ., West Lafayette, IN, USA
Volume
32
Issue
4
fYear
2009
Firstpage
221
Lastpage
232
Abstract
We describe double-lap shear experiments on Sn3.0Ag0.5Cu solder alloy, from which fits to Anand´s viscoplastic constitutive model, power-law creep model, and to time-hardening primary-secondary creep model are derived. Results of monotonic tests for strain rates ranging from 4.02E-6 to 2.40E-3 s-1, and creep response at stress levels ranging from 19.5 to 45.6 MPa are reported. Both types of tests were conducted at temperatures of 25degC, 75degC , and 125degC. Following an earlier study where Anand model and time hardening creep parameters for Sn3.8Ag0.7Cu and Sn1.0Ag0.5Cu solder alloys were reported, here we report power law model parameters so as to enable a comparison between all three alloys. Primary creep in Sn3.0Ag0.5Cu solder alloy is shown to be significant and are considered in addition to secondary creep and monotonic behavior. Aging influence on behavior is also shown to be significant. On the basis of experimental data, the following four aspects are discussed: 1) difference between testing on bulk versus joint specimen; 2) consistency between the creep and monotonic behaviors; 3) comparison against behaviors of Sn1.0Ag0.5Cu and Sn3.8Ag0.7Cu alloys as well as aganist Sn40Pb, 62Sn36Pb2Ag and 96.5Sn3.5Ag alloys; and 4) comparison of Sn3.0Ag0.5Cu and Sn3.8Ag0.7Cu relative to their aging response.
Keywords
ageing; copper alloys; silver alloys; solders; tin alloys; Anand model; SnAgCu; aging behavior; double-lap shear; power-law creep model; solder alloy; time hardening creep parameters; time-hardening primary-secondary creep model; viscoplastic constitutive model; Aging; Anand model; lead-free solders; power-law model; primary creep; time-hardening creep model;
fLanguage
English
Journal_Title
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
1521-334X
Type
jour
DOI
10.1109/TEPM.2009.2024119
Filename
5233878
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