DocumentCode
1371315
Title
Latent Log-Linear Models for Handwritten Digit Classification
Author
Deselaers, Thomas ; Gass, Tobias ; Heigold, Georg ; Ney, Hermann
Author_Institution
Google Switzerland, Zurich, Switzerland
Volume
34
Issue
6
fYear
2012
fDate
6/1/2012 12:00:00 AM
Firstpage
1105
Lastpage
1117
Abstract
We present latent log-linear models, an extension of log-linear models incorporating latent variables, and we propose two applications thereof: log-linear mixture models and image deformation-aware log-linear models. The resulting models are fully discriminative, can be trained efficiently, and the model complexity can be controlled. Log-linear mixture models offer additional flexibility within the log-linear modeling framework. Unlike previous approaches, the image deformation-aware model directly considers image deformations and allows for a discriminative training of the deformation parameters. Both are trained using alternating optimization. For certain variants, convergence to a stationary point is guaranteed and, in practice, even variants without this guarantee converge and find models that perform well. We tune the methods on the USPS data set and evaluate on the MNIST data set, demonstrating the generalization capabilities of our proposed models. Our models, although using significantly fewer parameters, are able to obtain competitive results with models proposed in the literature.
Keywords
handwritten character recognition; image classification; regression analysis; support vector machines; MNIST data set; USPS data set; discriminative deformation parameter training; handwritten digit classification; image deformation-aware log-linear models; latent log-linear mixture models; stationary point convergence; Approximation methods; Data models; Deformable models; Hidden Markov models; Kernel; Numerical models; Training; Log-linear models; OCR; conditional random fields; image classification.; latent variables; Algorithms; Image Interpretation, Computer-Assisted; Linear Models; Natural Language Processing; Pattern Recognition, Automated;
fLanguage
English
Journal_Title
Pattern Analysis and Machine Intelligence, IEEE Transactions on
Publisher
ieee
ISSN
0162-8828
Type
jour
DOI
10.1109/TPAMI.2011.218
Filename
6072215
Link To Document