• DocumentCode
    1371315
  • Title

    Latent Log-Linear Models for Handwritten Digit Classification

  • Author

    Deselaers, Thomas ; Gass, Tobias ; Heigold, Georg ; Ney, Hermann

  • Author_Institution
    Google Switzerland, Zurich, Switzerland
  • Volume
    34
  • Issue
    6
  • fYear
    2012
  • fDate
    6/1/2012 12:00:00 AM
  • Firstpage
    1105
  • Lastpage
    1117
  • Abstract
    We present latent log-linear models, an extension of log-linear models incorporating latent variables, and we propose two applications thereof: log-linear mixture models and image deformation-aware log-linear models. The resulting models are fully discriminative, can be trained efficiently, and the model complexity can be controlled. Log-linear mixture models offer additional flexibility within the log-linear modeling framework. Unlike previous approaches, the image deformation-aware model directly considers image deformations and allows for a discriminative training of the deformation parameters. Both are trained using alternating optimization. For certain variants, convergence to a stationary point is guaranteed and, in practice, even variants without this guarantee converge and find models that perform well. We tune the methods on the USPS data set and evaluate on the MNIST data set, demonstrating the generalization capabilities of our proposed models. Our models, although using significantly fewer parameters, are able to obtain competitive results with models proposed in the literature.
  • Keywords
    handwritten character recognition; image classification; regression analysis; support vector machines; MNIST data set; USPS data set; discriminative deformation parameter training; handwritten digit classification; image deformation-aware log-linear models; latent log-linear mixture models; stationary point convergence; Approximation methods; Data models; Deformable models; Hidden Markov models; Kernel; Numerical models; Training; Log-linear models; OCR; conditional random fields; image classification.; latent variables; Algorithms; Image Interpretation, Computer-Assisted; Linear Models; Natural Language Processing; Pattern Recognition, Automated;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/TPAMI.2011.218
  • Filename
    6072215