• DocumentCode
    1373405
  • Title

    ELDRS: Optimization Tools for the Switched Dose Rate Technique

  • Author

    Boch, J. ; Velo, Y. Gonzalez ; Saigné, F. ; Roche, N. J -H ; Perez, S. ; Schrimpf, R.D. ; Vaillé, J. -R ; Dusseau, L. ; Mekki, J. ; Lorfèvre, E. ; Ecoffet, R.

  • Author_Institution
    IES, Univ. Montpellier 2, Montpellier, France
  • Volume
    58
  • Issue
    6
  • fYear
    2011
  • Firstpage
    2998
  • Lastpage
    3003
  • Abstract
    As an accelerated test to characterize bipolar devices, the switched dose rate technique is a suitable solution for obtaining the entire low dose rate curve. Several sets of devices are first irradiated at high dose rate. Subsequently, all the sets are irradiated at low dose rate at the same time, which saves a considerable amount of time. The overall low dose rate curve is reconstructed by translating the individual curves obtained at low dose rate so that they form a continuous curve. The main issue of such a technique is that it requires several sets of devices. In this paper, optimization tools are presented to reduce the number of device sets and guidelines for their use are given.
  • Keywords
    bipolar logic circuits; materials testing; radiation effects; regression analysis; ELDRS; accelerated test; bipolar devices; device sets; guidelines; low dose rate curve; low dose rate irradiation; optimization tools; switched dose rate technique; Degradation; Extrapolation; Linear regression; Optimization; Pins; Radiation effects; Sensitivity analysis; Accelerated test method; ELDRS; dose rate; switching experiments; total dose;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/TNS.2011.2171003
  • Filename
    6075297