DocumentCode
1374020
Title
Electron beam sampling of IC-internal GHz signals
Author
Schmitt, Renata ; Winkler, Dietmar ; Brunner, Michael ; Lischke, B.
Author_Institution
Siemens Res. Labs., Munich
Volume
24
Issue
4
fYear
1988
fDate
2/18/1988 12:00:00 AM
Firstpage
235
Lastpage
236
Abstract
An electron beam test system has been developed which allows internal waveform measurements on integrated circuits operating with GHz frequencies. Internal signals of a 7 GHz frequency divider have been recorded. The e-beam system produces 15 ps electron pulses which allow rise time measurements down to 30 ps with less than 10% error and delay measurements below 5 ps
Keywords
digital integrated circuits; electron beam applications; integrated circuit testing; test equipment; 5 to 30 ps; IC-internal GHz signals; delay measurements; digital circuits; electron beam test system; electron pulses; integrated circuits; internal waveform measurements; rise time measurements;
fLanguage
English
Journal_Title
Electronics Letters
Publisher
iet
ISSN
0013-5194
Type
jour
Filename
5627
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