• DocumentCode
    1376150
  • Title

    Region competition: unifying snakes, region growing, and Bayes/MDL for multiband image segmentation

  • Author

    Zhu, Song Chun ; Yuille, Alan

  • Author_Institution
    Div. of Appl. Sci., Harvard Univ., Cambridge, MA, USA
  • Volume
    18
  • Issue
    9
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    884
  • Lastpage
    900
  • Abstract
    We present a novel statistical and variational approach to image segmentation based on a new algorithm, named region competition. This algorithm is derived by minimizing a generalized Bayes/minimum description length (MDL) criterion using the variational principle. The algorithm is guaranteed to converge to a local minimum and combines aspects of snakes/balloons and region growing. The classic snakes/balloons and region growing algorithms can be directly derived from our approach. We provide theoretical analysis of region competition including accuracy of boundary location, criteria for initial conditions, and the relationship to edge detection using filters. It is straightforward to generalize the algorithm to multiband segmentation and we demonstrate it on gray level images, color images and texture images. The novel color model allows us to eliminate intensity gradients and shadows, thereby obtaining segmentation based on the albedos of objects. It also helps detect highlight regions
  • Keywords
    Bayes methods; albedo; convergence of numerical methods; edge detection; image colour analysis; image segmentation; optimisation; variational techniques; Bayes method; albedos; boundary location; color images; convergence; edge detection; gray level images; local minimum; minimum description length; multiband image segmentation; region competition; region growing; snakes; texture images; uncertainty principle; variational principle; Color; Filtering; Filters; Image converters; Image edge detection; Image segmentation; Signal to noise ratio; Statistics; Testing; Uncertainty;
  • fLanguage
    English
  • Journal_Title
    Pattern Analysis and Machine Intelligence, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0162-8828
  • Type

    jour

  • DOI
    10.1109/34.537343
  • Filename
    537343