• DocumentCode
    1379400
  • Title

    RT-level ITC´99 benchmarks and first ATPG results

  • Author

    Corno, Fulvio ; Reorda, Matteo Sonza ; Squillero, Giovanni

  • Author_Institution
    Politecnico di Torino, Italy
  • Volume
    17
  • Issue
    3
  • fYear
    2000
  • Firstpage
    44
  • Lastpage
    53
  • Abstract
    New design flows require reducing work at the gate level and performing most activities before the synthesis step, including evaluation of testability of circuits. We propose a suite of RT-level benchmarks that help improve research in high-level ATPG tools. First results on the benchmarks obtained with our prototype tool show the feasibility of the approach
  • Keywords
    Automatic test pattern generation; Logic testing; Performance evaluation; ATPG; ATPG tools; RT-level benchmarks; Algorithm design and analysis; Automatic test pattern generation; Automatic testing; Benchmark testing; Circuit faults; Circuit synthesis; Circuit testing; Libraries; Logic testing; Prototypes;
  • fLanguage
    English
  • Journal_Title
    Design & Test of Computers, IEEE
  • Publisher
    ieee
  • ISSN
    0740-7475
  • Type

    jour

  • DOI
    10.1109/54.867894
  • Filename
    867894
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=1379400