• DocumentCode
    1379667
  • Title

    Electron-Hop-Funnel Measurements and Comparison With the Lorentz-2E Simulation

  • Author

    Lester, Charles ; Browning, Jim ; Matthews, Lael

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Boise State Univ., Boise, ID, USA
  • Volume
    39
  • Issue
    1
  • fYear
    2011
  • Firstpage
    555
  • Lastpage
    561
  • Abstract
    Electron hop funnels have been fabricated using a low-temperature cofired ceramic. The measurements of the hop-funnel I-V curve and electron energy distribution have been made using gated field emitters as the electron source. The charged particle simulation Lorentz 2E has been used to model the hop-funnel charging and to predict the - and energy characteristics. The results of this comparison indicate that the simulation can be used to design hop-funnel structures for use in various applications.
  • Keywords
    electron field emission; surface charging; vacuum microelectronics; Lorentz-2E simulation; electron energy distribution; electron source; electron-hop-funnel measurements; field emission arrays; gated field emitters; hop-funnel I-V curve measurement; hop-funnel charging; hop-funnel structure design; low-temperature cofired ceramic; Anodes; Current measurement; Logic gates; Stability analysis; Steady-state; Surface treatment; Electron emission; surface charging; vacuum microelectronics;
  • fLanguage
    English
  • Journal_Title
    Plasma Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0093-3813
  • Type

    jour

  • DOI
    10.1109/TPS.2010.2087775
  • Filename
    5638153