• DocumentCode
    1381945
  • Title

    SAW device modeling including velocity dispersion based on ZnO/diamond/Si layered structures

  • Author

    Hachigo, Akihiro ; Malocha, Donald C.

  • Author_Institution
    Itami Res. Labs., Sumitomo Electr. Ind. Ltd., Hyogo, Japan
  • Volume
    45
  • Issue
    3
  • fYear
    1998
  • fDate
    5/1/1998 12:00:00 AM
  • Firstpage
    660
  • Lastpage
    666
  • Abstract
    Surface acoustic wave (SAW) filter properties of ZnO/diamond/Si structures are calculated including velocity dispersion. The conventional SAW device modeling has previously been developed for bulk substrates. However, layered materials exhibit SAW velocity dispersion. The null frequency bandwidth of typical layered ZnO/diamond/Si structures is narrower than that calculated by conventional SAW device modeling techniques due to the velocity dispersion of the layered structures. The null frequency bandwidth of layered structures was calculated by the delta function model and the equivalent circuit model, including velocity dispersion, and compared with the experimental results. The dispersive equivalent circuit (DEC) model for layered structures is also presented. The results of these analysis are compared with the experimental results which show very good agreement.
  • Keywords
    diamond; equivalent circuits; silicon; surface acoustic wave filters; ultrasonic dispersion; ultrasonic velocity; zinc compounds; SAW device; ZnO-C-Si; delta function model; device modeling; equivalent circuit model; filter properties; layered structures; null frequency bandwidth; velocity dispersion; Dispersion; Electrodes; Equations; Equivalent circuits; Frequency response; Hafnium; Piezoelectric transducers; Surface acoustic wave devices; Surface acoustic waves; Zinc oxide;
  • fLanguage
    English
  • Journal_Title
    Ultrasonics, Ferroelectrics, and Frequency Control, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-3010
  • Type

    jour

  • DOI
    10.1109/58.677610
  • Filename
    677610