• DocumentCode
    1384076
  • Title

    Low overhead fault-tolerant FPGA systems

  • Author

    Lach, John ; Mangione-Smith, William H. ; Potkonjak, Miodrag

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., California Univ., Los Angeles, CA, USA
  • Volume
    6
  • Issue
    2
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    212
  • Lastpage
    221
  • Abstract
    Fault-tolerance is an important system metric for many operating environments, from automotive to space exploration. The conventional technique for improving system reliability is through component replication, which usually comes at significant cost: increased design time, testing, power consumption, volume, and weight. We have developed a new fault-tolerance approach that capitalizes on the unique reconfiguration capabilities of field programmable gate arrays (FPGA´s). The physical design is partitioned into a set of tiles. In response to a component failure, a functionally equivalent tile that does not rely on the faulty component replaces the affected tile. Unlike application specific integrated circuit (ASIC) and microprocessor design methods, which result in fixed structures, this technique allows a single physical component to provide redundant backup for several types of components. Experimental results conducted on a subset of the MCNC benchmarks demonstrate a high level of reliability with low timing and hardware overhead.
  • Keywords
    fault tolerant computing; field programmable gate arrays; integrated circuit reliability; reconfigurable architectures; redundancy; timing; MCNC benchmarks; fault-tolerant FPGA systems; functionally equivalent tile; overhead; reconfiguration capabilities; redundant backup; system metric; system reliability; timing; Application specific integrated circuits; Automotive engineering; Costs; Energy consumption; Fault tolerant systems; Field programmable gate arrays; Reliability; Space exploration; System testing; Tiles;
  • fLanguage
    English
  • Journal_Title
    Very Large Scale Integration (VLSI) Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    1063-8210
  • Type

    jour

  • DOI
    10.1109/92.678870
  • Filename
    678870