• DocumentCode
    1385249
  • Title

    Etching technique for determining diamond like carbon coating wear on the trailing edge of pseudo contact thin film sliders

  • Author

    Altshuler, Kenneth ; Kube, Todd ; Huynh, Chris

  • Author_Institution
    Seagate Technol., Longmont, CO, USA
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3705
  • Lastpage
    3707
  • Abstract
    A technique for evaluating the wear of Diamond Like Carbon (DLC) coating on the alumina encapsulation portion of coated pseudo contact thin film inductive sliders is presented. The tested parts were subjected to a chemical etch and were examined via Scanning Electron Microscope (SEM) techniques. Film voids and wear over the trailing edge were clearly revealed. Data regarding prime coated, prime uncoated heads and heads that have experienced CSS and sweeping actuation tests are presented. Prime sliders coated with approximately 150 Å of DLC were shown to contain small amounts of porosity and scratches, while heads without coating were uniformly etched. The amount of DLC wear on both CSS and sweeping heads was inconsistent and varied from near complete removal to slightly increased scratches. Inconsistency in wear is attributed to the variability among the heads´ flying characteristics
  • Keywords
    alumina; carbon; etching; magnetic heads; magnetic recording; materials testing; porosity; scanning electron microscopy; voids (solid); wear; wear resistant coatings; wear testing; 150 A; C; C-Al2O3; CSS tests; SEM techniques; alumina encapsulation portion; coating wear; diamond like carbon coating; etching technique; film voids; porosity; pseudo contact thin film sliders; scanning electron microscope techniques; scratches; sweeping actuation tests; trailing edge; Cascading style sheets; Coatings; Diamond-like carbon; Disk recording; Magnetic heads; Protection; Scanning electron microscopy; Sputter etching; Testing; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538810
  • Filename
    538810