• DocumentCode
    1385255
  • Title

    Composition monitoring for one year of lube cross-contamination of hard disks using aluminum substrates

  • Author

    Noda, Kohki ; Naoe, Masahiko

  • Author_Institution
    Res. Lab., IBM Japan Ltd., Tokyo, Japan
  • Volume
    32
  • Issue
    5
  • fYear
    1996
  • fDate
    9/1/1996 12:00:00 AM
  • Firstpage
    3708
  • Lastpage
    3710
  • Abstract
    The possibility of chemical reactions between different lubes for hard disks is a concern that should be investigated to ensure a high level of quality for hard disk drives when the same assembly process is used for different drives. To investigate cross-contamination by different disk lubes, a novel characterization method was developed, using an aluminum disk substrate with an Ni-P underlayer as a witness disk, instead of the silicon wafers currently used. One-year monitoring of organic and ionic materials in a clean room for manufacturing lines showed that the method had good detection ability and operability. It was also confirmed that lube cross-contamination was below the level at which it could cause chemical reactions between lubes
  • Keywords
    aluminium; hard discs; lubrication; magnetic recording; Al; Ni-P underlayer; aluminum substrate; chemical reaction; clean room; composition monitoring; hard disk drive; ionic material; lube cross-contamination; manufacturing line; organic material; witness disk; Aluminum; Assembly; Chemical technology; Cleaning; Hard disks; Manufacturing processes; Monitoring; Silicon; Substrates; Transistors;
  • fLanguage
    English
  • Journal_Title
    Magnetics, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9464
  • Type

    jour

  • DOI
    10.1109/20.538811
  • Filename
    538811