Investigation of head wear and contamination in helical scan tape systems

Author

Kim, Sookyung ; Prabhakaran, Vijay ; Talk, Frank E.

Author_Institution

Dept. of Appl. Mech. & Eng. Sci., California Univ., San Diego, La Jolla, CA, USA

Volume

32

Issue

5

fYear

1996

fDate

9/1/1996 12:00:00 AM

Firstpage

3741

Lastpage

3743

Abstract

The wear behavior of helical scan recorder heads is studied using the micro-indentation technique, where Vickers micro-indentations are spatially distributed on the head surface to provide a scale for wear measurement as a function of position. Atomic Force Microscopy is used to measure the wear rates with high accuracy. The maximum wear occurs in the trailing pole piece of the head. The MP tape proved to be more abrasive than the γFe₂O₃ tape. Chemical analysis of films forming in the glass region indicated iron oxide transfer from the tape to the head surface

Keywords

atomic force microscopy; magnetic heads; magnetic recording; magnetic tape equipment; surface contamination; wear; γ-Fe₂O₃ tape; Fe₂O₃; MP tape; Vickers micro-indentation; atomic force microscopy; chemical analysis; contamination; helical scan tape recorder; magnetic head; wear; Abrasives; Atomic force microscopy; Atomic measurements; Chemical analysis; Force measurement; Glass; Magnetic heads; Pollution measurement; Position measurement; Surface contamination;

fLanguage

English

Journal_Title

Magnetics, IEEE Transactions on

Publisher

ieee

ISSN

0018-9464

Type

jour

DOI

10.1109/20.538822

Filename

538822