Numerical Investigations on Edge Effects of Shielding Current Density in HTS Thick Film

Author

Ikuno, Soichiro ; Takayama, Teruou ; Kamitani, Atsushi

Author_Institution

Sch. of Comput. Sci., Tokyo Univ. of Tech nology, Tokyo, Japan

Volume

21

Issue

3

fYear

2011

fDate

6/1/2011 12:00:00 AM

Firstpage

3222

Lastpage

3225

Abstract

The permanent magnet method for measuring critical current density in high-temperature superconducting (HTS) film is numerically investigated. Numerical results show that the critical current density is approximately proportional to the maximum repulsive force. Furthermore, the values of proportional constant rapidly increase as the value of HTS radius R approaches to value of permanent magnet radius r_m . When the area where value of the shielding current density does not exceed the critical current density J_c exists even a little it is possible to evaluate the value of critical current density by using same proportional constant only measuring the electromagnetic interaction.

Keywords

critical current density (superconductivity); high-temperature superconductors; permanent magnets; superconducting thin films; HTS thick film; Shielding Current Density; critical current density; edge effects; electromagnetic interaction; high-temperature superconducting film; maximum repulsive force; permanent magnet method; Critical current density; Current density; Density measurement; Force; High temperature superconductors; Permanent magnets; Critical current density; element-free Galerkin method; high ${rm T}_{rm c}$ superconductor;

fLanguage

English

Journal_Title

Applied Superconductivity, IEEE Transactions on

Publisher

ieee

ISSN

1051-8223

Type

jour

DOI

10.1109/TASC.2010.2091242

Filename

5643137