• DocumentCode
    1388728
  • Title

    A fast voltage security assessment method using adaptive bounding

  • Author

    Liu, Hang ; Bose, Anjan ; Venkatasubramanian, Vaithianathan

  • Author_Institution
    Dept. of Electr. Eng. & Comput. Sci., Washington State Univ., Pullman, WA, USA
  • Volume
    15
  • Issue
    3
  • fYear
    2000
  • fDate
    8/1/2000 12:00:00 AM
  • Firstpage
    1137
  • Lastpage
    1141
  • Abstract
    This paper presents a fast method for use in power system online voltage security assessment. The objective here is to quickly assess the effects of large numbers of contingencies (line outages) to determine the worst case. The methodology is intuitively focused on the relationship between a node voltage and the availability of reactive power in the local neighborhood, and it also takes advantage of other information from the power flow solution. The concept of electrical distance is introduced for choosing the corresponding voltage control area locally around the contingency event. For the calculation of post-contingency electrical distance and power flow, the computation efficiency can be achieved by utilizing many mature algorithms from static security analysis (SSA)
  • Keywords
    control system analysis computing; load flow control; power system analysis computing; power system control; power system dynamic stability; power system faults; power system security; reactive power control; adaptive bounding; computation efficiency; contingencies; contingency event; electrical distance; fast voltage security assessment method; line outages; node voltage; power flow solution; power system online voltage security assessment; reactive power availability; static security analysis algorithms; voltage control area; Algorithm design and analysis; Availability; Energy management; Information security; Load flow; Power system security; Power transmission lines; Reactive power; Stability analysis; Voltage control;
  • fLanguage
    English
  • Journal_Title
    Power Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0885-8950
  • Type

    jour

  • DOI
    10.1109/59.871745
  • Filename
    871745