DocumentCode
1390056
Title
Modeling of Plastic Deformation Effects in Ferromagnetic Thin Films
Author
Sablik, Martin J. ; Geerts, Wilhelmus J. ; Smith, Kyle ; Gregory, Amanda ; Moore, Clayton ; Palmer, Daniel ; Bandyopadhyay, Anup ; Landgraf, Fernando J G ; de Campos, Marcos F.
Author_Institution
Appl. Magn. & Phys. Modeling, LLC, San Antonio, TX, USA
Volume
46
Issue
2
fYear
2010
Firstpage
491
Lastpage
494
Abstract
To explain the magnetic behavior of plastic deformation of thin magnetic films (Fe and permalloy) on an elastic substrate (nitinol), it is noted that unlike in the bulk, the dislocation density does not increase dramatically because of the dimensional constraint. As a result, the resulting residual stress, even though strain hardening is limited, dominates the observed magnetic behavior. Thus, with the field parallel to the stress axis, the compressive residual stress resulting from plastic deformation causes a decrease in remanence and an increase in coercivity; and with the field perpendicular to the stress axis, the resulting compressive residual stress causes an increase in remanence and a decrease in coercivity. These elements have been inserted into the model previously developed for plastic deformation in the bulk, producing the aforementioned behavior, which has been observed experimentally in the films.
Keywords
Permalloy; coercive force; dislocation density; ferromagnetic materials; internal stresses; iron; magnetic thin films; magnetomechanical effects; plastic deformation; remanence; work hardening; Fe; NiFe; coercivity; compressive residual stress; dislocation density; elastic substrate; ferromagnetic thin films; permalloy; plastic deformation; remanence; strain hardening; Coercive force; Compressive stress; Deformable models; Iron; Magnetic field induced strain; Magnetic films; Magnetoelasticity; Plastic films; Remanence; Residual stresses; Magnetic films; magnetic hysteresis; magnetomechanical effects; plastic deformation;
fLanguage
English
Journal_Title
Magnetics, IEEE Transactions on
Publisher
ieee
ISSN
0018-9464
Type
jour
DOI
10.1109/TMAG.2009.2033456
Filename
5393184
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