• DocumentCode
    1390861
  • Title

    Evaluation of surveillance test interval from risk viewpoint

  • Author

    Chou, H.P. ; Wang, Y.H. ; Wei, Y.S. ; Lin, T.J.

  • Author_Institution
    Dept. of Nucl. Eng., Nat. Tsing Hua Univ., Hsinchu, Taiwan
  • Volume
    45
  • Issue
    3
  • fYear
    1998
  • fDate
    6/1/1998 12:00:00 AM
  • Firstpage
    1009
  • Lastpage
    1013
  • Abstract
    The paper presents the application of the probabilistic risk assessment (PRA) technique for surveillance test interval (STI) evaluation. Assessment was performed for the reactor protection system (RPS) and based upon the living PRA model of the Taipower´s Maanshan power plant. A fault tree was developed and analyzed to find the most proper subsystem for test interval relaxation. Comparisons were made for generic data and plant specific data sets; approaches of staggered test versus sequential test were also compared. Sensitivity studies were made to evaluate the uncertainty of human error and common cause failure factors. Event tree analyses were made to calculate core melt down frequencies for test induced transients and anticipated transient without scram (ATWS) events and to evaluate the effect of STI relaxation. Results indicated that an extension of three times of the current RPS test interval has no significant risk impact for the Maanshan plant
  • Keywords
    fault trees; fission reactor accidents; fission reactor safety; fission reactor theory; nuclear power stations; surveillance; ATWS; Maanshan nuclear plant; PRA; anticipated transient without scram; common cause failure; core melt down frequencies; event tree; fault tree; human error; probabilistic risk assessment; reactor protection system; sequential test; staggered test; surveillance test interval; test induced transients; Fault trees; Inductors; Power generation; Power system modeling; Power system protection; Risk management; Sequential analysis; Surveillance; Testing; Transient analysis;
  • fLanguage
    English
  • Journal_Title
    Nuclear Science, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0018-9499
  • Type

    jour

  • DOI
    10.1109/23.682698
  • Filename
    682698