DocumentCode
1391070
Title
Parametric analysis of steam driven delamination in electronics packages
Author
Lam, David C C ; Chong, I.T. ; Tong, Pin
Author_Institution
Dept. of Mech. Eng., Hong Kong Univ., China
Volume
23
Issue
3
fYear
2000
fDate
7/1/2000 12:00:00 AM
Firstpage
208
Lastpage
213
Abstract
Steam driven delamination between molding compound and substrate is analytically modeled. Pressure based delamination criterion and steam evaporation based criterion are examined as a function of crack size. Comparison with reported experimental trends revealed that steam based delamination criterion Nc is more descriptive of the stable and fast fracture regimes in steam driven delamination in electronics packages during solder reflow heat treatment. Following the establishment of the criterion, the driving force for delamination Ns is modeled. Delamination occurs when Ns equals or exceeds Nc. Parametric investigations on the influence of molding compound thickness, defect size, elastic modulus, and critical strain energy released rate with and without humidity pre-conditioning were conducted using the analytical model. The study revealed that the critical delamination temperature is controlled by the defect size and the decrease in the critical strain energy released rate resulting from exposure to a humid environment. To minimize steam driven delamination, defect size and water degradation of critical strain energy released rate should be minimized
Keywords
delamination; elastic moduli; encapsulation; heat treatment; humidity; modelling; packaging; reflow soldering; reliability; steam; thermal stress cracking; analytical model; crack size; critical delamination temperature; critical strain energy released rate; defect size; elastic modulus; electronic packages; epoxy molding compound; fast fracture regime; humid environment; humidity pre-conditioning; molding compound thickness; parametric analysis; pressure based delamination criterion; solder reflow heat treatment; steam driven delamination; steam evaporation based criterion; substrate; water degradation; Analytical models; Capacitive sensors; Delamination; Electronics packaging; Heat treatment; Humidity control; Semiconductor device modeling; Size control; Strain control; Temperature control;
fLanguage
English
Journal_Title
Electronics Packaging Manufacturing, IEEE Transactions on
Publisher
ieee
ISSN
1521-334X
Type
jour
DOI
10.1109/6104.873249
Filename
873249
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