• DocumentCode
    1394045
  • Title

    A fault model for PLAs

  • Author

    Ligthart, Michiel M. ; Stans, Rudi J.

  • Author_Institution
    Philips Res. Labs., Sunnyvale, CA, USA
  • Volume
    10
  • Issue
    2
  • fYear
    1991
  • fDate
    2/1/1991 12:00:00 AM
  • Firstpage
    265
  • Lastpage
    270
  • Abstract
    A fault model for programmable logic arrays (PLAs) is discussed. This model maps realistic failures on four classes of faults: multiple stuck-at faults, multiple bridging faults, multiple crosspoint faults, and faults due to breaks in lines. It is shown that multiple stuck-at faults are equivalent to multiple crosspoint faults, multiple bridging faults are sub-equivalent to multiple crosspoint faults, and the set of patterns detecting multiple crosspoint faults is a subset of the set of patterns detecting multiple bridging faults. Hence, the set of patterns detecting multiple crosspoint faults also detects all multiple stuck-at faults and multiple bridging faults. This reduces the fault model for PLAs to two classes: multiple missing/extra crosspoint faults and multiple breaks
  • Keywords
    fault location; logic arrays; logic testing; fault model; line breaks; multiple bridging faults; multiple crosspoint faults; multiple stuck-at faults; programmable logic arrays; Built-in self-test; Circuit faults; Computer errors; Decoding; Design automation; Error analysis; Fault detection; Laboratories; Logic testing; Programmable logic arrays;
  • fLanguage
    English
  • Journal_Title
    Computer-Aided Design of Integrated Circuits and Systems, IEEE Transactions on
  • Publisher
    ieee
  • ISSN
    0278-0070
  • Type

    jour

  • DOI
    10.1109/43.68414
  • Filename
    68414