DocumentCode
1394906
Title
Pulsed laser validation of recovery mechanisms of critical SEEs in an artificial neural network system
Author
Buchner, S. ; Olmos, M. ; Cheynet, Ph. ; Velazco, R. ; McMorrow, D. ; Melinger, J. ; Ecoffet, R. ; Muller, J.D. ; Ecoffet, R.
Author_Institution
SFA Inc., Washington, DC, USA
Volume
45
Issue
3
fYear
1998
fDate
6/1/1998 12:00:00 AM
Firstpage
1501
Lastpage
1507
Abstract
A pulsed laser was used to inject errors into an electronic system consisting of a number of different integrated circuits functioning as a digital version of an artificial neural network. The results confirm that the system as a whole can operate autonomously in the radiation environment of space. Additional work was done to characterize the effects of the upsets on the output of the artificial neural network
Keywords
errors; laser beam effects; neural chips; artificial neural network; critical SEE; digital integrated circuit; electronic system; error injection; pulsed laser irradiation; recovery; space radiation environment; Aerospace engineering; Artificial neural networks; Extraterrestrial measurements; Laboratories; Life estimation; Optical pulses; Pulse measurements; Redundancy; Single event upset; System testing;
fLanguage
English
Journal_Title
Nuclear Science, IEEE Transactions on
Publisher
ieee
ISSN
0018-9499
Type
jour
DOI
10.1109/23.685230
Filename
685230
Link To Document