Methodology of Soft Error Rate Computation in Modern Microelectronics

Author

Zebrev, Gennady Ivanovich ; Ishutin, Igor Olegovich ; Useinov, Rustem Galeyevich ; Anashin, Vasily Sergeyevich

Author_Institution

Nat. Res. Nucl. Univ. MEPHI, Moscow, Russia

Volume

57

Issue

6

fYear

2010

Firstpage

3725

Lastpage

3733

Abstract

We have proposed a test methodology based on successive experimental determination of angular cross-section dependence followed by averaging over full solid angle. Equivalence between phenomenological and chord-length distribution averaging for soft error rate computation is shown. Role of energy-loss straggling in subthreshold error rate enhancement has been revealed. Nuclear reaction induced error rate computation method providing crossover between BGR and chord-length approaches has been proposed. Possibility of inclusion of multiple bit error rate estimation in a unified computational scheme is shown.

Keywords

error statistics; integrated circuit testing; nuclear reactions and scattering; BGR; angular cross-section dependence; chord-length approaches; chord-length distribution averaging; energy-loss straggling; equivalence; modern microelectronics; multiple bit error rate estimation; nuclear reaction induced error rate computation method; phenomenological distribution averaging; soft error rate computation; subthreshold error rate enhancement; Bit error rate; Error analysis; Microelectronics; Energy deposition; LET; multiple bit error; nuclear reactions; sensitive volume; soft error rate; straggling;

fLanguage

English

Journal_Title

Nuclear Science, IEEE Transactions on

Publisher

ieee

ISSN

0018-9499

Type

jour

DOI

10.1109/TNS.2010.2073487

Filename

5658083