DocumentCode
1395980
Title
Texture Classification Using Refined Histogram
Author
Li, L. ; Tong, C.S. ; Choy, S.K.
Author_Institution
Dept. of Math., Hong Kong Baptist Univ., Hong Kong, China
Volume
19
Issue
5
fYear
2010
fDate
5/1/2010 12:00:00 AM
Firstpage
1371
Lastpage
1378
Abstract
In this correspondence, we propose a novel, efficient, and effective Refined Histogram (RH) for modeling the wavelet subband detail coefficients and present a new image signature based on the RH model for supervised texture classification. Our RH makes use of a step function with exponentially increasing intervals to model the histogram of detail coefficients, and the concatenation of the RH model parameters for all wavelet subbands forms the so-called RH signature. To justify the usefulness of the RH signature, we discuss and investigate some of its statistical properties. These properties would clarify the sufficiency of the signature to characterize the wavelet subband information. In addition, we shall also present an efficient RH signature extraction algorithm based on the coefficient-counting technique, which helps to speed up the overall classification system performance. We apply the RH signature to texture classification using the well-known databases. Experimental results show that our proposed RH signature in conjunction with the use of symmetrized Kullback-Leibler divergence gives a satisfactory classification performance compared with the current state-of-the-art methods.
Keywords
feature extraction; image classification; image texture; statistical analysis; wavelet transforms; Kullback-Leibler divergence; RH model parameters concatenation; RH signature extraction algorithm; coefficient-counting technique; image signature; refined histogram; state-of-the-art methods; statistical properties; step function; supervised texture classification; wavelet subband detail coefficients modeling; Histogram; statistical modeling; texture classification; Algorithms; Data Interpretation, Statistical; Image Enhancement; Image Interpretation, Computer-Assisted; Imaging, Three-Dimensional; Pattern Recognition, Automated; Reproducibility of Results; Sensitivity and Specificity;
fLanguage
English
Journal_Title
Image Processing, IEEE Transactions on
Publisher
ieee
ISSN
1057-7149
Type
jour
DOI
10.1109/TIP.2010.2041414
Filename
5398920
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