• DocumentCode
    1396568
  • Title

    Quantitative quality assessment of stitched panoramic images

  • Author

    Qureshi, H.S. ; Khan, M.M. ; Hafiz, Rakibul ; Cho, Youngkyu ; Cha, Jaehyuk

  • Author_Institution
    Sch. of Electr. Eng. & Comput. Sci., Nat. Univ. of Sci. & Technol., Islamabad, Pakistan
  • Volume
    6
  • Issue
    9
  • fYear
    2012
  • fDate
    12/1/2012 12:00:00 AM
  • Firstpage
    1348
  • Lastpage
    1358
  • Abstract
    In this study, the authors present quantitative quality assessment indices for measuring geometric and photometric qualities of stitched panoramic images, since both geometric and photometric qualities are important for obtaining a seamless panoramic image. For geometric quality assessment, our approach is based on the use of structural similarity (SSIM) index between the high-frequency information (HFI) of both geometrically corrected unstitched images and the stitched panoramic image. This measure is called `HFI`SSIM`. The complementary low-frequency information from the same pair of images is used for assessing the photometric quality of the stitched image using the spectral angle mapper and intensity magnitude ratio measures. The proposed quality metrics are tested on both synthetic and true datasets comprising of indoor and outdoor scenes. The results obtained, highlight the interest of using the proposed quantitative measures for assessing the quality of stitched panoramic images.
  • Keywords
    image processing; SSIM index; angle mapper; geometric qualities; geometrically corrected unstitched images; high-frequency information; intensity magnitude ratio measures; photometric qualities; quantitative quality assessment; seamless panoramic image; stitched panoramic images; structural similarity index;
  • fLanguage
    English
  • Journal_Title
    Image Processing, IET
  • Publisher
    iet
  • ISSN
    1751-9659
  • Type

    jour

  • DOI
    10.1049/iet-ipr.2011.0641
  • Filename
    6407295